• DocumentCode
    521546
  • Title

    Femtosecond dispersion measurements of 1.3 µm quantum dot semiconductor optical amplifier

  • Author

    Bagnell, M. ; Davila-Rodriguez, J. ; Ardey, A. ; Delfyett, P.J.

  • Author_Institution
    CREOL, Univ. of Central Florida, Orlando, FL, USA
  • fYear
    2010
  • fDate
    16-21 May 2010
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Spectral interferometry is used to measure the dispersion of a quantum dot semiconductor optical amplifier under various injection current values in the wavelength range of 1200 to 1340 nm, spanning ground and first excited state.
  • Keywords
    excited states; ground states; laser variables measurement; light interferometry; optical dispersion; optical testing; quantum dot lasers; semiconductor optical amplifiers; femtosecond dispersion measurements; first excited state; ground state; quantum dot semiconductor optical amplifier; spectral interferometry; wavelength 1.3 mum; wavelength 1200 nm to 1340 nm; Bandwidth; Delay; Dispersion; Interference; Laser mode locking; Optical interferometry; Quantum dot lasers; Quantum dots; Semiconductor optical amplifiers; Ultrafast optics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics (CLEO) and Quantum Electronics and Laser Science Conference (QELS), 2010 Conference on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-55752-890-2
  • Electronic_ISBN
    978-1-55752-890-2
  • Type

    conf

  • Filename
    5501230
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=521546