Title :
Femtosecond dispersion measurements of 1.3 µm quantum dot semiconductor optical amplifier
Author :
Bagnell, M. ; Davila-Rodriguez, J. ; Ardey, A. ; Delfyett, P.J.
Author_Institution :
CREOL, Univ. of Central Florida, Orlando, FL, USA
Abstract :
Spectral interferometry is used to measure the dispersion of a quantum dot semiconductor optical amplifier under various injection current values in the wavelength range of 1200 to 1340 nm, spanning ground and first excited state.
Keywords :
excited states; ground states; laser variables measurement; light interferometry; optical dispersion; optical testing; quantum dot lasers; semiconductor optical amplifiers; femtosecond dispersion measurements; first excited state; ground state; quantum dot semiconductor optical amplifier; spectral interferometry; wavelength 1.3 mum; wavelength 1200 nm to 1340 nm; Bandwidth; Delay; Dispersion; Interference; Laser mode locking; Optical interferometry; Quantum dot lasers; Quantum dots; Semiconductor optical amplifiers; Ultrafast optics;
Conference_Titel :
Lasers and Electro-Optics (CLEO) and Quantum Electronics and Laser Science Conference (QELS), 2010 Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-55752-890-2
Electronic_ISBN :
978-1-55752-890-2
