• DocumentCode
    521579
  • Title

    Fabrication of PCSS Based on AFM and Photolithograph

  • Author

    Liu, Qinggang ; Zhang, Kai ; Xin, Jindong ; Hu, Xiaotang

  • Author_Institution
    State Key Lab. of Precision Meas. Technol. & Instrum., Tianjin Univ., Tianjin, China
  • fYear
    2010
  • fDate
    19-21 June 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Several ten nanometers width TiOx wires was fabricated on the surface of 3~5 nm thick Ti lines which covers GaAs substrate. TiOx wires are fabricated by atomic force microscope (AFM), and the Ti lines are fabricated by photolithograph method. Oxide is used as insulator/energy barrier between the electrodes to substitute the air gap of traditional type photoconductive semiconductive switches (PCSS). The electrodes and substrate´s materials are Ti-Au and LT-GaAs respectively. The simulation result indicated that the voltage or current output characteristic of the PCSS is different from the traditional switch. In this paper, this phenomenon is analyzed and the method to avoid such kind of non-linearity output is discussed.
  • Keywords
    III-V semiconductors; atomic force microscopy; electro-optical devices; gallium arsenide; photoconducting switches; photolithography; titanium compounds; AFM; GaAs; PCSS; TiO; atomic force microscope; insulator/energy barrier; photoconductive semiconductive switches; photolithograph; Atomic force microscopy; Electrodes; Energy barrier; Fabrication; Gallium arsenide; Insulation; Photoconducting devices; Substrates; Switches; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photonics and Optoelectronic (SOPO), 2010 Symposium on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-4963-7
  • Electronic_ISBN
    978-1-4244-4964-4
  • Type

    conf

  • DOI
    10.1109/SOPO.2010.5504010
  • Filename
    5504010