DocumentCode :
521579
Title :
Fabrication of PCSS Based on AFM and Photolithograph
Author :
Liu, Qinggang ; Zhang, Kai ; Xin, Jindong ; Hu, Xiaotang
Author_Institution :
State Key Lab. of Precision Meas. Technol. & Instrum., Tianjin Univ., Tianjin, China
fYear :
2010
fDate :
19-21 June 2010
Firstpage :
1
Lastpage :
4
Abstract :
Several ten nanometers width TiOx wires was fabricated on the surface of 3~5 nm thick Ti lines which covers GaAs substrate. TiOx wires are fabricated by atomic force microscope (AFM), and the Ti lines are fabricated by photolithograph method. Oxide is used as insulator/energy barrier between the electrodes to substitute the air gap of traditional type photoconductive semiconductive switches (PCSS). The electrodes and substrate´s materials are Ti-Au and LT-GaAs respectively. The simulation result indicated that the voltage or current output characteristic of the PCSS is different from the traditional switch. In this paper, this phenomenon is analyzed and the method to avoid such kind of non-linearity output is discussed.
Keywords :
III-V semiconductors; atomic force microscopy; electro-optical devices; gallium arsenide; photoconducting switches; photolithography; titanium compounds; AFM; GaAs; PCSS; TiO; atomic force microscope; insulator/energy barrier; photoconductive semiconductive switches; photolithograph; Atomic force microscopy; Electrodes; Energy barrier; Fabrication; Gallium arsenide; Insulation; Photoconducting devices; Substrates; Switches; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photonics and Optoelectronic (SOPO), 2010 Symposium on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-4963-7
Electronic_ISBN :
978-1-4244-4964-4
Type :
conf
DOI :
10.1109/SOPO.2010.5504010
Filename :
5504010
Link To Document :
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