DocumentCode
521579
Title
Fabrication of PCSS Based on AFM and Photolithograph
Author
Liu, Qinggang ; Zhang, Kai ; Xin, Jindong ; Hu, Xiaotang
Author_Institution
State Key Lab. of Precision Meas. Technol. & Instrum., Tianjin Univ., Tianjin, China
fYear
2010
fDate
19-21 June 2010
Firstpage
1
Lastpage
4
Abstract
Several ten nanometers width TiOx wires was fabricated on the surface of 3~5 nm thick Ti lines which covers GaAs substrate. TiOx wires are fabricated by atomic force microscope (AFM), and the Ti lines are fabricated by photolithograph method. Oxide is used as insulator/energy barrier between the electrodes to substitute the air gap of traditional type photoconductive semiconductive switches (PCSS). The electrodes and substrate´s materials are Ti-Au and LT-GaAs respectively. The simulation result indicated that the voltage or current output characteristic of the PCSS is different from the traditional switch. In this paper, this phenomenon is analyzed and the method to avoid such kind of non-linearity output is discussed.
Keywords
III-V semiconductors; atomic force microscopy; electro-optical devices; gallium arsenide; photoconducting switches; photolithography; titanium compounds; AFM; GaAs; PCSS; TiO; atomic force microscope; insulator/energy barrier; photoconductive semiconductive switches; photolithograph; Atomic force microscopy; Electrodes; Energy barrier; Fabrication; Gallium arsenide; Insulation; Photoconducting devices; Substrates; Switches; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Photonics and Optoelectronic (SOPO), 2010 Symposium on
Conference_Location
Chengdu
Print_ISBN
978-1-4244-4963-7
Electronic_ISBN
978-1-4244-4964-4
Type
conf
DOI
10.1109/SOPO.2010.5504010
Filename
5504010
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