DocumentCode :
521735
Title :
More Effective Supervised Learning in Randomized Trees for Feature Recognition
Author :
Guo, Junwei ; Chen, Jing ; Wang, Yongtian ; Liu, Wei
Author_Institution :
Sch. of Optoelectron., Beijing Inst. of Technol., Beijing, China
fYear :
2010
fDate :
19-21 June 2010
Firstpage :
1
Lastpage :
4
Abstract :
This paper presents a feature recognition method based on randomized trees. We aim to improve the performance of Lepetit´s work, whose actual results are very sensitive to large changes of viewpoint due to its limited ability of samples synthesizing and learning. We propose an approach to alleviate its limitation, which simulates the image appearance changes under actual viewpoint changes by applying general projective transformations to the standard image rather than affine ones. Affine transformations are usually used in many state-of-the-arts but they cannot adequately represent the actual relationship between two images with different viewpoints. The result is a more effective way of supervised image sample learning in randomized trees for feature recognition that is robust to large changes of viewpoints.
Keywords :
affine transforms; feature extraction; image sampling; learning (artificial intelligence); trees (mathematics); Lepetits work; affine transformation; feature recognition method; image appearance changes; randomized tree; supervised image sample learning; Classification tree analysis; Computer vision; Detectors; Image recognition; Object detection; Paper technology; Robustness; Supervised learning; Support vector machine classification; Support vector machines;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photonics and Optoelectronic (SOPO), 2010 Symposium on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-4963-7
Electronic_ISBN :
978-1-4244-4964-4
Type :
conf
DOI :
10.1109/SOPO.2010.5504467
Filename :
5504467
Link To Document :
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