• DocumentCode
    521841
  • Title

    Fast antenna testing using advanced probe array technology

  • Author

    Durand, L. ; Duchesne, L. ; Foged, L.J.

  • Author_Institution
    SATIMO´´s Main Office, Courtaboeuf, France
  • fYear
    2010
  • fDate
    12-16 April 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The use of probe array is a well established technology for spherical near field systems offering all the possibilities and accuracies of traditional single probe testing at a much faster speed [1–4]. Frequency ranges for probe arrays are from 75MHz to 40GHz. Recently the problem of exhaustive testing of the high number of multi beam antennas embarked on future satellite systems has received considerable attention [5]. Based on conventional measurements techniques this testing would lead to unacceptable cost and duration. Solutions based on “hybrid systems” taking full advantage of fast probe array technology on large mechanical scanners can drastically reduce the measurement time compared to conventional single probe test systems. This paper discusses the use of probe array technology for fast antenna testing in Space, Automotive, Military and Telecom applications.
  • Keywords
    Antenna arrays; Antenna measurements; Costs; Directional antennas; Frequency; Measurement techniques; Probes; Satellites; Space technology; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation (EuCAP), 2010 Proceedings of the Fourth European Conference on
  • Conference_Location
    Barcelona, Spain
  • Print_ISBN
    978-1-4244-6431-9
  • Electronic_ISBN
    978-84-7653-472-4
  • Type

    conf

  • Filename
    5504989