DocumentCode :
521841
Title :
Fast antenna testing using advanced probe array technology
Author :
Durand, L. ; Duchesne, L. ; Foged, L.J.
Author_Institution :
SATIMO´´s Main Office, Courtaboeuf, France
fYear :
2010
fDate :
12-16 April 2010
Firstpage :
1
Lastpage :
4
Abstract :
The use of probe array is a well established technology for spherical near field systems offering all the possibilities and accuracies of traditional single probe testing at a much faster speed [1–4]. Frequency ranges for probe arrays are from 75MHz to 40GHz. Recently the problem of exhaustive testing of the high number of multi beam antennas embarked on future satellite systems has received considerable attention [5]. Based on conventional measurements techniques this testing would lead to unacceptable cost and duration. Solutions based on “hybrid systems” taking full advantage of fast probe array technology on large mechanical scanners can drastically reduce the measurement time compared to conventional single probe test systems. This paper discusses the use of probe array technology for fast antenna testing in Space, Automotive, Military and Telecom applications.
Keywords :
Antenna arrays; Antenna measurements; Costs; Directional antennas; Frequency; Measurement techniques; Probes; Satellites; Space technology; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation (EuCAP), 2010 Proceedings of the Fourth European Conference on
Conference_Location :
Barcelona, Spain
Print_ISBN :
978-1-4244-6431-9
Electronic_ISBN :
978-84-7653-472-4
Type :
conf
Filename :
5504989
Link To Document :
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