Title :
Validation of ridge gap waveguide performance using in-house TRL calibration kit
Author :
Zaman, Ashraf Uz ; Kildal, Per-Simon ; Ferndahl, Mattias ; Kishk, Ahmed
Author_Institution :
Dept. of Signals & Syst., Chalmers Univ. of Technol., Göteborg, Sweden
Abstract :
In this work, the low-loss performance of the recently evolved ridge gap waveguide technology has been demonstrated. A TRL calibration kit was designed to do the calibration of the manufactured ridge gap waveguide demonstrator. The calibrated S-parameters for the gap waveguide demonstrator are presented in this work and it is verified that the ridge gap waveguide work according to simulations with wide bandwidth and low loss. The loss of the gap waveguide section was found to be so low that it cannot be quantified for the chosen waveguide length due to measurement uncertainties arising from imperfect connectors, possible imperfections in standards of the TRL kit due to manufacturing tolerance, VNA random errors etc.
Keywords :
Bandwidth; Calibration; Conductors; Connectors; Manufacturing; Measurement standards; Nails; Scattering parameters; Surface waves; Waveguide discontinuities;
Conference_Titel :
Antennas and Propagation (EuCAP), 2010 Proceedings of the Fourth European Conference on
Conference_Location :
Barcelona, Spain
Print_ISBN :
978-1-4244-6431-9
Electronic_ISBN :
978-84-7653-472-4