DocumentCode :
522756
Title :
Background modeling for adaptive nonuniformity correction in IRFPA
Author :
Mou, Xingang ; Cui, Qi ; Zhang, Guilin ; Hu, Ruolan ; Zhou, Xiao
Author_Institution :
Inst. for Pattern Recognition & Artificial Intell., Huazhong Univ. of Sci. & Technol., Wuhan, China
Volume :
1
fYear :
2010
fDate :
10-11 May 2010
Firstpage :
84
Lastpage :
87
Abstract :
The performance of infrared focal plane array (IRFPA) is known to be affected by the presence of spatial fixed pattern noise (FPN) that is superimposed on the true image. Scene-based nonuniformity correction (NUC) algorithms are widely concerned since they only need the readout infrared data captured by the imaging system during its normal operation. Temporal highpass filter is popular because of its simpleness and effectiveness. However, there still exists the problem of ghosting artifact in the algorithms caused by blind update of parameters, and the performance is noticeably degraded when the methods are applied over scenes with lack of motion. In order to tackle with this problem, a novel adaptive NUC algorithm based on background modeling is presented. In this algorithm, the drift of the detectors is assumed to obey a single Gaussian distribution, and the update of the parameters is selectively performed based on the scene. The performance of the proposed algorithm is evaluated with infrared image sequences with simulated and real fixed-pattern noise. The results show a more reliable fixed-pattern noise reduction, tracking the parameter drift, and presenting a good adaptability to scene changes.
Keywords :
Calibration; Degradation; Detectors; Infrared imaging; Layout; Least squares approximation; Noise reduction; Optical arrays; Optical filters; Temperature measurement; backgournd modeling; nonuniformity correction; temporal highpass filter;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optics Photonics and Energy Engineering (OPEE), 2010 International Conference on
Conference_Location :
Wuhan, China
Print_ISBN :
978-1-4244-5234-7
Electronic_ISBN :
978-1-4244-5236-1
Type :
conf
DOI :
10.1109/OPEE.2010.5508097
Filename :
5508097
Link To Document :
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