DocumentCode :
523507
Title :
A correlation-based design space exploration methodology for multi-processor systems-on-chip
Author :
Mariani, G. ; Brankovic, A. ; Palermo, G. ; Jovic, J. ; Zaccaria, V. ; Silvano, C.
Author_Institution :
ALaRI, Univ. of Lugano, Lugano, Switzerland
fYear :
2010
fDate :
13-18 June 2010
Firstpage :
120
Lastpage :
125
Abstract :
Given the increasing complexity of multi-processor systems-on-chip, a wide range of parameters must be tuned to find the best trade-offs in terms of the selected system figures of merit (such as energy, delay and area). This optimization phase is called Design Space Exploration (DSE) consisting of a Multi-Objective Optimization (MOO) problem. In this paper, we propose an iterative design space exploration methodology exploiting the statistical properties of known system configurations to infer, by means of a correlation-based analysis, the next design points to be analyzed with low-level simulations. In fact, the knowledge of few design points is used to predict the expected improvement of unknown configurations. We show that the correlation of the configurations within the multi-processor design space can be modeled successfully with analytical functions and, thus, speed up the overall exploration phase. This makes the proposed methodology a model-assisted heuristic that, for the first time, exploits the correlation about architectural configurations to converge to the solution of the multi-objective problem.
Keywords :
correlation methods; integrated circuit design; microprocessor chips; optimisation; system-on-chip; SoC; correlation-based design space exploration methodology; figures of merit; iterative design space exploration methodology; model-assisted heuristic; multiobjective optimization problem; multiprocessor systems-on-chip; Analytical models; Context modeling; Delay; Design automation; Design methodology; Design optimization; Embedded computing; Iterative methods; Permission; Space exploration; Design Space Exploration; Kriging; Multi-Processor Systems-on-Chip; Response Surface;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference (DAC), 2010 47th ACM/IEEE
Conference_Location :
Anaheim, CA
ISSN :
0738-100X
Print_ISBN :
978-1-4244-6677-1
Type :
conf
Filename :
5522350
Link To Document :
بازگشت