• DocumentCode
    523680
  • Title

    SCUD: A fast single-pass L1 cache simulation approach for embedded processors with Round-robin replacement policy

  • Author

    Haque, Mohammad Shihabul ; Peddersen, Jorgen ; Janapsatya, Andhi ; Parameswaran, Sri

  • Author_Institution
    Univ. of New South Wales, Sydney, NSW, Australia
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    356
  • Lastpage
    361
  • Abstract
    Embedded systems designers are free to choose the most suitable configuration of L1 cache in modern processor based SoCs. Choosing the appropriate L1 cache configuration necessitates the simulation of long memory access traces to accurately obtain hit/miss rates. The long execution time taken to simulate these traces, particularly separate simulation for each configuration is a major drawback. Researchers have proposed techniques to speed up the simulation of caches with LRU replacement policy. These techniques are of little use in the majority of embedded processors as these processors utilize Round-robin policy based caches. In this paper we propose a fast L1 cache simulation approach, called SCUD(Sorted Collection of Unique Data), for caches with the Round-robin policy. SCUD is a single-pass cache simulator that can simulate multiple L1 cache configurations (with varying set sizes and associativities) by reading the application trace once. Utilizing fast binary searches in a novel data structure, SCUD simulates an application trace significantly faster than a widely used single configuration cache simulator (Dinero IV). We show SCUD can simulate a set of cache configurations up to 57 times faster than Dinero IV. SCUD shows an average speed up of 19.34 times over Dinero IV for Mediabench applications, and an average speed up of over 10 times for SPEC CPU2000 applications.
  • Keywords
    Analytical models; Australia; Cache memory; Data structures; Embedded system; Energy consumption; Performance analysis; Permission; Process design; Round robin; Cache simulation; L1 cache; Miss rate; Round robin; Simulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (DAC), 2010 47th ACM/IEEE
  • Conference_Location
    Anaheim, CA, USA
  • ISSN
    0738-100X
  • Print_ISBN
    978-1-4244-6677-1
  • Type

    conf

  • Filename
    5522812