Title :
A statistical simulation method for reliability analysis of SRAM core-cells
Author :
Fonseca, R.A. ; Dilillo, L. ; Bosio, A. ; Girard, P. ; Pravossoudovitch, S. ; Viraze, A. ; Badereddine, N.
Author_Institution :
Infineon Technol. France, Sophia-Antipolis, France
Abstract :
Reliability analysis of SRAM core-cells requires statistical methods with very high accuracy to cope with very low failure probabilities. Although new statistical methods have been recently proposed, to the best of our knowledge, there is no method able to evaluate the joint failure probability (the probability that at least one failure mechanism occurs) of an SRAM core-cell with enough accuracy in a reasonable time. We propose a statistical simulation method based on the analytical integration of the multivariate Gaussian distribution function.
Keywords :
Analytical models; Computational modeling; Failure analysis; Measurement; Performance analysis; Probability; Random access memory; Random variables; Resource description framework; Sampling methods; Monte-Carlo; Reliability Analysis; SRAM Core-cell;
Conference_Titel :
Design Automation Conference (DAC), 2010 47th ACM/IEEE
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
978-1-4244-6677-1