Title :
Fully X-tolerant, very high scan compression
Author :
Wohl, Peter ; Waicukauski, John A. ; Neuveux, Frederic ; Gizdarski, Emil
Author_Institution :
Synopsys, Inc., Mountain View, CA, USA
Abstract :
This paper presents a new X-blocking system which allows very high compression and full coverage even if the density of unknown values is very high and varies every shift. Despite the presence of Xs in scan cells, compression can be maximized by using PRPG and MISR structures. Results on industrial designs with various X densities demonstrate consistently high compression and full test coverage.
Keywords :
Algorithm design and analysis; Automatic test pattern generation; Bandwidth; Circuit faults; Circuit testing; Computer architecture; Costs; Integrated circuit reliability; Phase shifters; Predictive models; Compression; LFSR; MISR; VLSI Test; X-tolerant;
Conference_Titel :
Design Automation Conference (DAC), 2010 47th ACM/IEEE
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
978-1-4244-6677-1
