DocumentCode :
523787
Title :
Post-silicon validation opportunities, challenges and recent advances
Author :
Mitra, Subhasish ; Seshia, Sanjit A. ; Nicolici, Nicola
Author_Institution :
Dept. of EE, Stanford Univ., Stanford, CA, USA
fYear :
2010
fDate :
13-18 June 2010
Firstpage :
12
Lastpage :
17
Abstract :
Post-silicon validation is used to detect and fix bugs in integrated circuits and systems after manufacture. Due to sheer design complexity, it is nearly impossible to detect and fix all bugs before manufacture. Post-silicon validation is a major challenge for future systems. Today, it is largely viewed as an art with very few systematic solutions. As a result, post-silicon validation is an emerging research topic with several exciting opportunities for major innovations in electronic design automation. In this paper, we provide an overview of the post-silicon validation problem and how it differs from traditional pre-silicon verification and manufacturing testing. We also discuss major postsilicon validation challenges and recent advances.
Keywords :
Circuit faults; Circuit testing; Computer bugs; Computer crashes; Crosstalk; Digital systems; Integrated circuit manufacture; Manufacturing; System testing; Technological innovation; Post-silicon validation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference (DAC), 2010 47th ACM/IEEE
Conference_Location :
Anaheim, CA, USA
ISSN :
0738-100X
Print_ISBN :
978-1-4244-6677-1
Type :
conf
Filename :
5523095
Link To Document :
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