• DocumentCode
    523811
  • Title

    Efficient fault simulation on many-core processors

  • Author

    Kochte, Michael A. ; Schaal, Marcel ; Wunderlich, Hans-Joachim ; Zoellin, Christian G.

  • Author_Institution
    Inst. fuer Tech. Inf., Univ. Stuttgart, Stuttgart, Germany
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    380
  • Lastpage
    385
  • Abstract
    Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structures are particularly computationally expensive as a large number of patterns has to be evaluated. In this work, we propose to map a fault simulation algorithm based on the parallel-pattern single-fault propagation (PPSFP) paradigm to many-core architectures and describe the involved algorithmic optimizations. Many-core architectures are characterized by a high number of simple execution units with small local memory. The proposed fault simulation algorithm exploits the parallelism of these architectures by use of parallel data structures. The algorithm is implemented for the NVIDIA GT200 Graphics Processing Unit (GPU) architecture and achieves a speed-up of up to 17x compared to an existing GPU fault-simulation algorithm and up to 16x compared to state-of-the-art algorithms on conventional processor architectures.
  • Keywords
    computer graphic equipment; coprocessors; data structures; fault simulation; integrated circuit design; GPU architecture; fault simulation; graphic processing unit architecture; integrated circuit; many core processor; parallel data structure; parallel pattern single fault propagation paradigm; Analytical models; Circuit analysis; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Computer architecture; Integrated circuit reliability; Integrated circuit testing; Pattern analysis; Many-Core Processors; PPSFP; Parallel Fault Simulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (DAC), 2010 47th ACM/IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    0738-100X
  • Print_ISBN
    978-1-4244-6677-1
  • Type

    conf

  • Filename
    5523154