DocumentCode :
523947
Title :
Implementation of Illuminance Measuring System with Silicon Photocell for Integral Stereolithography System
Author :
Guangshen, Xu ; Dongcai, Tan ; Jing, Jin ; Sheng, Luo
Author_Institution :
Xi´´an Polytech. Univ., Xi´´an, China
Volume :
2
fYear :
2010
fDate :
11-12 May 2010
Firstpage :
498
Lastpage :
501
Abstract :
The illuminance on the imaging plane of integral Stereolithography system influences cured depth of resin and fabrication accuracy of part during building process. To control the cured depth of resin and fabrication accuracy, an illuminance measuring system using silicon photocell is developed. The illuminance measuring system consists of MCU, silicon photocell, gain adjustment circuit, I/V switching and amplifying circuit, RS-232 communication interface, LCD module and keyboard. The light illuminance signal received by silicon photocell is converted to weakly electric current signal, and current signal is converted to voltage signal and magnified via I/V switching and amplifying circuit, then the voltage signal is input to MCU to be processed. In terms of digital signal and the sensitivity of silicon photocell, the real illuminance value can be calculated. Measuring results are displayed with LCD and sent to PC with RS-232 communication interface. The lmplementation of illuminance measuring system provides a tool for control fabrication accuracy of part in building process for the integral Stereolithography system.
Keywords :
curing; instruments; lighting; microfabrication; photoelectric cells; production engineering computing; rapid prototyping (industrial); resins; silicon; stereolithography; I-V switching; LCD module; MCU; RS-232 communication interface; amplifying circuit; building process; control fabrication accuracy; cured depth; electric current signal; gain adjustment circuit; illuminance measuring system; imaging plane; integral stereolithography system; keyboard; resin; silicon photocell; voltage signal; Communication switching; Communication system control; Control systems; Fabrication; Resins; Signal processing; Silicon; Stereolithography; Switching circuits; Voltage; Illuminance measurement; Rapid Prototyping; Silicon photocell; digital potentiometer; integral Stereolithography system;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Computation Technology and Automation (ICICTA), 2010 International Conference on
Conference_Location :
Changsha
Print_ISBN :
978-1-4244-7279-6
Electronic_ISBN :
978-1-4244-7280-2
Type :
conf
DOI :
10.1109/ICICTA.2010.334
Filename :
5523466
Link To Document :
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