• DocumentCode
    524076
  • Title

    Instruction-driven clock scheduling with glitch mitigation

  • Author

    Gu-Yeon Wei ; Brooks, David ; Khan, A.D. ; Xiaoyao Liang

  • Author_Institution
    Sch. of Eng. & Appl. Sci., Harvard Univ., Cambridge, MA, USA
  • fYear
    2008
  • fDate
    11-13 Aug. 2008
  • Firstpage
    357
  • Lastpage
    362
  • Abstract
    Instruction-driven clock scheduling is a mechanism that minimizes clock power in deeply-pipelined datapaths. Analysis of realistic processor workloads shows a preponderance of bubbles persist through pipelines like the floating point unit. Clock scheduling ostensibly adapts pipeline depth with respect to bubbles in the instruction stream without performance loss. Unfortunately, shallower pipelines (i.e. longer pipe stages) are prone to larger amounts of glitches propagating through logic, increasing dynamic power. Experimentally measured results from a 130 nm FPU test chip with flexible clocking capabilities show a super-linear increase in glitch-induced dynamic power for shallower pipelines. While higher glitch power can severely diminish the power savings offered by clock scheduling, judicious clocking of intermediate stages offers glitch mitigation to recover power savings for worst-case scenarios. Detailed analysis of clock scheduling applied to a FPU in a POWER4-like processor running realistic workloads shows an average net power savings of 15% compared to an aggressively clock-gated design.
  • Keywords
    clocks; coprocessors; floating point arithmetic; pipeline processing; power aware computing; power consumption; processor scheduling; FPU test chip; POWER4-like processor; bubbles; clock power; deeply-pipelined datapaths; floating point unit; glitch mitigation; instruction stream; instruction-driven clock scheduling; pipeline depth; power savings; preponderance; realistic processor workloads; shallower pipelines; size 130 nm; Clocks; Costs; Energy management; Logic; Microprocessors; Pipeline processing; Power measurement; Processor scheduling; Semiconductor device measurement; Testing; clock gating; floating point unit; glitch power; low power;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Low Power Electronics and Design (ISLPED), 2008 ACM/IEEE International Symposium on
  • Conference_Location
    Bangalore
  • Print_ISBN
    978-1-4244-8634-2
  • Electronic_ISBN
    978-1-60558-109-5
  • Type

    conf

  • DOI
    10.1145/1393921.1394017
  • Filename
    5529017