DocumentCode
524076
Title
Instruction-driven clock scheduling with glitch mitigation
Author
Gu-Yeon Wei ; Brooks, David ; Khan, A.D. ; Xiaoyao Liang
Author_Institution
Sch. of Eng. & Appl. Sci., Harvard Univ., Cambridge, MA, USA
fYear
2008
fDate
11-13 Aug. 2008
Firstpage
357
Lastpage
362
Abstract
Instruction-driven clock scheduling is a mechanism that minimizes clock power in deeply-pipelined datapaths. Analysis of realistic processor workloads shows a preponderance of bubbles persist through pipelines like the floating point unit. Clock scheduling ostensibly adapts pipeline depth with respect to bubbles in the instruction stream without performance loss. Unfortunately, shallower pipelines (i.e. longer pipe stages) are prone to larger amounts of glitches propagating through logic, increasing dynamic power. Experimentally measured results from a 130 nm FPU test chip with flexible clocking capabilities show a super-linear increase in glitch-induced dynamic power for shallower pipelines. While higher glitch power can severely diminish the power savings offered by clock scheduling, judicious clocking of intermediate stages offers glitch mitigation to recover power savings for worst-case scenarios. Detailed analysis of clock scheduling applied to a FPU in a POWER4-like processor running realistic workloads shows an average net power savings of 15% compared to an aggressively clock-gated design.
Keywords
clocks; coprocessors; floating point arithmetic; pipeline processing; power aware computing; power consumption; processor scheduling; FPU test chip; POWER4-like processor; bubbles; clock power; deeply-pipelined datapaths; floating point unit; glitch mitigation; instruction stream; instruction-driven clock scheduling; pipeline depth; power savings; preponderance; realistic processor workloads; shallower pipelines; size 130 nm; Clocks; Costs; Energy management; Logic; Microprocessors; Pipeline processing; Power measurement; Processor scheduling; Semiconductor device measurement; Testing; clock gating; floating point unit; glitch power; low power;
fLanguage
English
Publisher
ieee
Conference_Titel
Low Power Electronics and Design (ISLPED), 2008 ACM/IEEE International Symposium on
Conference_Location
Bangalore
Print_ISBN
978-1-4244-8634-2
Electronic_ISBN
978-1-60558-109-5
Type
conf
DOI
10.1145/1393921.1394017
Filename
5529017
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