Title : 
Design of dual threshold voltages asynchronous circuits
         
        
            Author : 
Ghavami, Behnam ; Pedram, Hossein
         
        
            Author_Institution : 
Amirkabir Univ. of Technol., Tehran, Iran
         
        
        
        
        
        
            Abstract : 
This paper introduces a framework for the minimization of leakage power consumption of asynchronous circuits via using dual threshold voltages technique. The utilized circuit model is an extended Timed Petri-Net which captures the dynamic behavior of the circuit. We propose a heuristic method based on quantum genetic algorithm which finds the optimal high and low threshold voltage assignment. Experimental results are given for a number of 90 nm ISCAS benchmark circuits. From the experimental results, we show that the combination of asynchronous and multiple threshold voltage design techniques is an effective way to achieve low leakage power budget in high performance asynchronous circuits.
         
        
            Keywords : 
Petri nets; asynchronous circuits; genetic algorithms; logic design; low-power electronics; minimisation; ISCAS benchmark circuits; dual threshold voltages asynchronous circuit design; dual threshold voltages technique; high performance asynchronous circuits; leakage power consumption; low leakage power budget; minimization; multiple threshold voltage design techniques; quantum genetic algorithm; threshold voltage assignment; timed Petri-net; utilized circuit model; Asynchronous circuits; Circuit synthesis; Clocks; Delay; Design automation; Energy consumption; Genetic algorithms; Minimization; Permission; Threshold voltage; asynchronous circuits; dual threshold voltage; genetic quantum algorithm; leakage power; timed petri-net;
         
        
        
        
            Conference_Titel : 
Low Power Electronics and Design (ISLPED), 2008 ACM/IEEE International Symposium on
         
        
            Conference_Location : 
Bangalore
         
        
            Print_ISBN : 
978-1-4244-8634-2
         
        
            Electronic_ISBN : 
978-1-60558-109-5
         
        
        
            DOI : 
10.1145/1393921.1393970