DocumentCode
524130
Title
Power-gating-aware high-level synthesis
Author
Eunjoo Choi ; Changsik Shin ; Taewhan Kim ; Youngsoo Shin
Author_Institution
Syst. IC Bus. Team, LG Electron., Seoul, South Korea
fYear
2008
fDate
11-13 Aug. 2008
Firstpage
39
Lastpage
44
Abstract
A problem inherent in designing power-gated circuits is the overhead of the state-retention storage required to preserve the circuit state in standby mode. Reducing the amount of retention storage is known to be the most influential factor in minimizing the loss of the benefit (i.e. power saving) by power-gating. In this paper, we address a new problem of high-level synthesis with the objective of minimizing the size of retention storage to be used in the power-gated circuits. Specifically, we propose a complete design framework, called HLS-pg, that starts from the power-gating-aware scheduling, allocation, and controller synthesis down to the final circuit layout. The key contribution of the work is to solve the power-gating-aware scheduling problem, namely, scheduling operations that minimizes the number of retention registers required at the power-gating control step, while satisfying resource and latency constraints. In experiments on benchmark designs implemented in 65-nm CMOS technology, HLS-pg generates circuits with 27% less leakage current, with 6% less circuit area and wirelength, compared to the power-gated circuits produced by conventional high-level synthesis.
Keywords
high level synthesis; integer programming; linear programming; logic circuits; scheduling; CMOS technology; HLS-pg framework; allocation synthesis; controller synthesis; high-level synthesis; latency constraint; power-gated circuits; power-gating-aware scheduling problem; resource constraint; retention registers; scheduling synthesis; size 65 nm; state-retention storage overhead; CMOS logic circuits; CMOS technology; Circuit synthesis; Flip-flops; High level synthesis; Integrated circuit synthesis; Latches; Leakage current; Logic design; Registers; high-level synthesis; leakage; power-gating;
fLanguage
English
Publisher
ieee
Conference_Titel
Low Power Electronics and Design (ISLPED), 2008 ACM/IEEE International Symposium on
Conference_Location
Bangalore
Print_ISBN
978-1-4244-8634-2
Electronic_ISBN
978-1-60558-109-5
Type
conf
DOI
10.1145/1393921.1393936
Filename
5529072
Link To Document