DocumentCode :
524417
Title :
Mapping annotated sequence diagram to a Petri net notation for reliability evaluation
Author :
Emadi, Sima
Author_Institution :
Eng. Dept., Islamic Azad Univ., Yazd, Iran
Volume :
3
fYear :
2010
fDate :
22-24 June 2010
Abstract :
The quality of software architecture has a great influence on achieving non-functional requirements to the software system. In this paper, we propose an approach based on Petri nets models for reliability prediction of software systems at the software architecture level, specified by UML. UML lacks a formal semantics and hence it is not possible to apply, directly, mathematical techniques on UML models for reliability evaluation. To reach this goal we propose an automatic translation of UML Diagrams into Petri Nets. In this paper we study the use of Sequence Diagrams for the reliability evaluation of software architecture. Starting from annotated UML sequence diagrams we derive a reliability models based on Petri nets. The UML model is annotated according to the UML profile for Quality of Service and Fault Tolerance. The proposed algorithm translates the annotated UML specification into Petri net reliability models, which can then be analyzed using standard techniques. Reliability results are feedback at the software architecture level in the UML diagrams.
Keywords :
Petri nets; Unified Modeling Language; software architecture; software fault tolerance; software quality; Petri net notation; UML diagrams; annotated sequence diagram mapping; fault tolerance; quality of service; reliability evaluation; software architecture quality; software systems reliability prediction; Algorithm design and analysis; Fault tolerance; Feedback; Mathematical model; Petri nets; Predictive models; Quality of service; Software architecture; Software systems; Unified modeling language; executable model; petri net; reliability evaluation; sequence diagram; software architecture;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Education Technology and Computer (ICETC), 2010 2nd International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-6367-1
Type :
conf
DOI :
10.1109/ICETC.2010.5529597
Filename :
5529597
Link To Document :
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