• DocumentCode
    52474
  • Title

    Effect of the Quantum-Well Shape on the Performance of InGaN-Based Light-Emitting Diodes Emitting in the 400–500-nm Range

  • Author

    Salhi, Abdelmajid ; Alanzi, Mohammad ; Alonazi, Bandar

  • Author_Institution
    Nat. Nanotechnol. Res. Centre, King Abdulaziz City for Sci. & Technol., Riyadh, Saudi Arabia
  • Volume
    11
  • Issue
    3
  • fYear
    2015
  • fDate
    Mar-15
  • Firstpage
    217
  • Lastpage
    222
  • Abstract
    The electrical and optical properties of InGaN-GaN light-emitting diodes (LEDs) emitting in the 400-500-nm range and having a v-shaped quantum well (VSQW) and a u-shaped quantum well (USQW) are numerically investigated using APSYS simulation program. The simulation results showed that the devices containing VSQW have superior performance in terms of optical power and internal quantum efficiency droop compared to those with USQW. The optical power of the LEDs containing USQW increases gradually and reaches a maximum at 460 nm; however, the optical power of the LEDs with VSQW improves gradually, and the maximum is obtained in a window from 420 to 436 nm as a result of radiative recombination enhancement. The simulation results suggest that the higher performance of the VSQW is due to piezoelectric field reduction and an enhancement of electron and hole wave functions overlap.
  • Keywords
    III-V semiconductors; gallium compounds; indium compounds; integrated optoelectronics; light emitting diodes; semiconductor quantum wells; wide band gap semiconductors; APSYS simulation program; InGaN-GaN; LED; USQW; VSQW; electrical properties; electron wave function; hole wave function; internal quantum efficiency droop; light emitting diodes; optical power; optical properties; piezoelectric field reduction; quantum well shape effect; radiative recombination enhancement; u-shaped quantum well; v-shaped quantum well; wavelength 400 nm to 500 nm; Charge carrier processes; Gallium nitride; Indium; Light emitting diodes; Radiative recombination; Stimulated emission; GaN; InGaN; light-emitting diode (LED); simulation;
  • fLanguage
    English
  • Journal_Title
    Display Technology, Journal of
  • Publisher
    ieee
  • ISSN
    1551-319X
  • Type

    jour

  • DOI
    10.1109/JDT.2014.2373387
  • Filename
    6964797