• DocumentCode
    524976
  • Title

    Research of fault diagnosis method of analog circuit based on improved support vector machines

  • Author

    Li, Hua ; Yin, Bin ; Li, Nan ; Guo, Jianhua

  • Author_Institution
    Sch. of Inf. Sci. & Eng., Northeastern Univ., Shenyang, China
  • Volume
    1
  • fYear
    2010
  • fDate
    30-31 May 2010
  • Firstpage
    494
  • Lastpage
    497
  • Abstract
    This paper propose improved support vector machine algorithm. The algorithm includes preprocessing the sample training set, improvement of the binary tree classification algorithm and incremental sample learning algorithm. Considering the specific classification precision requirements of analog circuit fault diagnosis, the three algorithms are integrated, and achieve good results. The simulation of analog circuit demonstrate that the improved algorithm has higher classification precision and faster diagnosis speed compared to traditional support vector machine algorithm.
  • Keywords
    Analog circuits; Artificial neural networks; Circuit faults; Classification algorithms; Dictionaries; Fault diagnosis; Fault tolerance; Neural networks; Support vector machine classification; Support vector machines; Analog Circuit; Fault Diagnosis; Improved Support Vector Machine;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Mechatronics and Automation (ICIMA), 2010 2nd International Conference on
  • Conference_Location
    Wuhan, China
  • Print_ISBN
    978-1-4244-7653-4
  • Type

    conf

  • DOI
    10.1109/ICINDMA.2010.5538189
  • Filename
    5538189