DocumentCode
524986
Title
A new method for refractive index measurement of isotropic and anisotropic materials in millimeter and submillimeter wave range
Author
Andrushchak, N.A. ; Bobitskii, Ya V. ; Maksymyuk, T.V. ; Syrotynsky, O.I. ; Andrushchak, A.S. ; Karbovnyk, I.D.
Author_Institution
Dept. of Photonics, Lviv Polytech. Nat. Univ., Lviv, Ukraine
fYear
2010
fDate
14-16 June 2010
Firstpage
1
Lastpage
3
Abstract
Based on patented by us interferometer-turning method the experimental set-up for refractive index measurement of parallel plates from isotropic and anisotropic materials in ranges millimeter-submillimeter (mm-submm) wave length have been created and described. The process of interference fringe shift measurement that based on created software has been analyzed, necessary working correlations have been given and experimental accuracy of refractive indexes measurement has been appraised.
Keywords
Anisotropic magnetoresistance; Dielectric measurements; Mirrors; Optical resonators; Optical waveguides; Permittivity measurement; Position measurement; Refractive index; Submillimeter wave measurements; Wavelength measurement; interferometric-turning method; isotropic and anisotropic materials; refractive index;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Radar and Wireless Communications (MIKON), 2010 18th International Conference on
Conference_Location
Vilnius, Lithuania
Print_ISBN
978-1-4244-5288-0
Type
conf
Filename
5540338
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