Title :
Calibration of a 220–325 GHz vector-network-analyzer with multiple rectangular-waveguide sections
Author :
Lewandowski, Arkadiusz ; Wiatr, Wojciech
Author_Institution :
Inst. of Electron. Syst., Warsaw Univ. of Technol., Warsaw, Poland
Abstract :
We study the performance of the multiline through-reflect-line method in the calibration of a 220-325 GHz vector-network-analyzer with WR-03 rectangular-waveguide test-ports. The calibration method is based on multiple uniform-waveguide sections with unknown propagation constant and different lengths, a reflect standard which is assumed to be identical on both vector-network-analyzer ports but otherwise unknown, and a direct thru connection of the test ports. Experimental verification demonstrates that the multiline through-reflect-line technique yields repeatable and physically meaningful results.
Keywords :
calibration; network analysers; rectangular waveguides; calibration method; multiline through-reflect-line method; multiple rectangular-waveguide sections; multiple uniform-waveguide sections; vector-network-analyzer; Apertures; Calibration; Flanges; Fluctuations; Frequency measurement; Manufacturing; Propagation constant; Scattering parameters; Submillimeter wave technology; Wavelength measurement;
Conference_Titel :
Microwave Radar and Wireless Communications (MIKON), 2010 18th International Conference on
Conference_Location :
Vilnius
Print_ISBN :
978-1-4244-5288-0