• DocumentCode
    52508
  • Title

    Fourier Lucas-Kanade Algorithm

  • Author

    Lucey, Simon ; Navarathna, Rajitha ; Ashraf, Ahmed Bilal ; Sridharan, Sridha

  • Author_Institution
    Commonwealth Science and Industrial Research Organisation (CSIRO), Brisbane
  • Volume
    35
  • Issue
    6
  • fYear
    2013
  • fDate
    Jun-13
  • Firstpage
    1383
  • Lastpage
    1396
  • Abstract
    In this paper, we propose a framework for both gradient descent image and object alignment in the Fourier domain. Our method centers upon the classical Lucas & Kanade (LK) algorithm where we represent the source and template/model in the complex 2D Fourier domain rather than in the spatial 2D domain. We refer to our approach as the Fourier LK (FLK) algorithm. The FLK formulation is advantageous when one preprocesses the source image and template/model with a bank of filters (e.g., oriented edges, Gabor, etc.) as 1) it can handle substantial illumination variations, 2) the inefficient preprocessing filter bank step can be subsumed within the FLK algorithm as a sparse diagonal weighting matrix, 3) unlike traditional LK, the computational cost is invariant to the number of filters and as a result is far more efficient, and 4) this approach can be extended to the Inverse Compositional (IC) form of the LK algorithm where nearly all steps (including Fourier transform and filter bank preprocessing) can be precomputed, leading to an extremely efficient and robust approach to gradient descent image matching. Further, these computational savings translate to nonrigid object alignment tasks that are considered extensions of the LK algorithm, such as those found in Active Appearance Models (AAMs).
  • Keywords
    Active appearance model; Integrated circuits; Jacobian matrices; Lighting; Linear programming; Robustness; Vectors; Fourier domain; Lucas & Kanade (LK); active appearance model (AAM); illumination invariance; Algorithms; Facial Expression; Fourier Analysis; Humans; Image Processing, Computer-Assisted; Pattern Recognition, Automated;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2012.220
  • Filename
    6327194