DocumentCode
525082
Title
Resonator techniques for reflectivity and surface resistivity at high temperature: Methodology and measurements
Author
Parshin, Vladimir ; Serov, Eugenie ; Ravanelli, Rodolfo ; van´t Klooster, C.G.M.
Author_Institution
Appl. Phys. Inst., RAS, Nizhny Novgorod, Russia
fYear
2010
fDate
14-16 June 2010
Firstpage
1
Lastpage
5
Abstract
Two different methodologies based on resonator techniques are presented. The first has been realized for wide band reflectivity characterization at high temperature while the second has been developed to verify surface resistivity including roughness, surface contamination and other undesired effect. Both methods have been developed for characterization over a large temperature range. Measurement results on Ti6Al4V samples, Copper and AlBeMet ® are presented.
Keywords
Conductivity; Copper; Pollution measurement; Reflectivity; Rough surfaces; Surface contamination; Surface roughness; Temperature distribution; Temperature measurement; Wideband; Fabry-Perot; Surface reflectivity; resonator techniques; surface resistivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Radar and Wireless Communications (MIKON), 2010 18th International Conference on
Conference_Location
Vilnius, Lithuania
Print_ISBN
978-1-4244-5288-0
Type
conf
Filename
5540487
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