Title :
The design of high reliable serial system BUS
Author :
Xiaoyan, Zhu ; Zhang Weigong ; Wang Jianfeng ; Duan Qingya ; Liu Shurong
Author_Institution :
Coll. of Inf. Eng., Capital Normal Univ., Beijing, China
Abstract :
With the development of astronavigation and aviation technology, the currently high-reliable serious bus can not meet the requirement fully and totally show at follow aspects: 1 low system bus speed and the bus load up to 85%; 2 low system intelligentize and the bus takes too many time of CPU; 3 imperfect preventive measure for Single Event Upset (SEU) and can not adapt space vile environment. For the short coming and future development demand, the high performance and strengthening single-chip intelligent 1553B bus controller need to be researched. It uses TOP-DOWN technique, faced to space vile environment and has independent intellectual property rights. On this basic, we have researched further key technology which impact embedded system such as SOC/SIP system integration, IP design and application and so on, and explored SOC/SIP Integration of electronic systems in space applications.
Keywords :
embedded systems; microcontrollers; navigation; radiation effects; space vehicle electronics; system buses; IP design; SOC/SIP system integration; astronavigation technology; aviation technology; bus load; electronic systems; embedded system; high reliable serial system bus; intellectual property rights; single event upset; single-chip intelligent 1553B bus controller; space applications; space vile environment; system bus speed; top-down technique; Current measurement; Embedded system; Extraterrestrial measurements; Intellectual property; Intelligent systems; Single event upset; Space technology; System buses; Time measurement; Velocity measurement; 1553B; I/O Processor; SOC; high-reliability serial bus;
Conference_Titel :
Computer Design and Applications (ICCDA), 2010 International Conference on
Conference_Location :
Qinhuangdao
Print_ISBN :
978-1-4244-7164-5
Electronic_ISBN :
978-1-4244-7164-5
DOI :
10.1109/ICCDA.2010.5541400