DocumentCode :
525859
Title :
Normally-off AlGaN/GaN HFET with p-type Ga Gate and AlGaN buffer
Author :
Hilt, O. ; Knauer, A. ; Brunner, F. ; Bahat-Treidel, E. ; Würfl, J.
Author_Institution :
Ferdinand-Braun-Inst., Leibniz Inst. fuer Hoechstfrequenztechnik, Berlin, Germany
fYear :
2010
fDate :
6-10 June 2010
Firstpage :
347
Lastpage :
350
Abstract :
A 1.5 A normally-off GaN transistor for power applications in p-type GaN gate technology with a modified epitaxial layer structure is presented. A higher threshold voltage is achieved while keeping the on-state resistance low by using an AlGaN buffer instead of a GaN buffer. Additionally, the AlGaN buffer acts as a back-barrier and suppresses source-drain punch-through currents in the off-state. P-GaN gate GaN transistors with AlGaN buffer will therefore yield higher breakdown voltages as compared to standard GaN buffer versions which results in an excellent VBr-to-RON ratio. The proposed normally-off technology shows save operation under elevated ambient temperature up to 200°C without thermal runaway. In contrast to standard Schottky-gate AlGaN/GaN HEMTs, a reverse diode operation is possible for off-state conditions which may enable improved inverter circuits.
Keywords :
Schottky gate field effect transistors; buffer circuits; electric breakdown; epitaxial layers; high electron mobility transistors; invertors; power transistors; AlGaN buffer; AlGaN-GaN; Schottky-gate AlGaN-GaN HEMT; breakdown voltages; current 1.5 A; improved inverter circuits; low on-state resistance; modified epitaxial layer structure; normal-off AlGaN-GaN HFET; p-GaN gate GaN transistors; p-type GaN gate buffer technology; reverse diode operation; source-drain punch-through current suppression; threshold voltage; Aluminum gallium nitride; Circuits; Epitaxial layers; Gallium nitride; HEMTs; Inverters; MODFETs; Schottky diodes; Temperature; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices & IC's (ISPSD), 2010 22nd International Symposium on
Conference_Location :
Hiroshima
ISSN :
1943-653X
Print_ISBN :
978-1-4244-7718-0
Electronic_ISBN :
1943-653X
Type :
conf
Filename :
5543864
Link To Document :
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