Title :
Simulation techniques for fault diagnosis of digital circuits based on LASAR
Author :
Wei, Su ; Manru, Gao ; Ying, Liu
Author_Institution :
Dept. of Electr. Eng., Beijing Union Univ., Beijing, China
Abstract :
On the basis of scientific research projects recently completed by the author, and through analysis for contents of fault test, this paper makes a detailed description of methods for fault test, which provides fault dictionary method, coding method and comparison method. The assay mainly stipulates fault simulation analysis based on LASAR (Logic Automatic Stimulate and Response), and gives four major steps of the development for fault simulation software including modeling of tested unit, simulation of a normal board, fault simulation and post-treatment, and realizes 96.59% of fault coverage rate of excitations.
Keywords :
circuit simulation; digital circuits; digital simulation; fault simulation; LASAR; digital circuits; fault diagnosis; fault simulation software; normal board simulation; simulation techniques; Analytical models; Dictionaries; Load modeling; Digital Circuits; Fault Diagnosis; LASAR; Simulation Techniques;
Conference_Titel :
Computer and Communication Technologies in Agriculture Engineering (CCTAE), 2010 International Conference On
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-6944-4
DOI :
10.1109/CCTAE.2010.5545152