• DocumentCode
    526385
  • Title

    Notice of Retraction
    A study on static stability of series seismic isolation system based on shooting method

  • Author

    Du Yong-feng ; Zhu Qian-kun

  • Author_Institution
    Inst. of Earthquake Protection & Disaster Mitigation, LANZhou Univ. of Technol., Lanzhou, China
  • Volume
    6
  • fYear
    2010
  • fDate
    9-11 July 2010
  • Firstpage
    155
  • Lastpage
    158
  • Abstract
    Notice of Retraction

    After careful and considered review of the content of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE´s Publication Principles.

    We hereby retract the content of this paper. Reasonable effort should be made to remove all past references to this paper.

    The presenting author of this paper has the option to appeal this decision by contacting TPII@ieee.org.

    In this paper, the static stability of series seismic isolation system is considered. First, the mathematical model of the static stability of series seismic isolation system is established, and then, the solving thought by shooting method is expatiated. Finally, the static stability of two kinds of series seismic isolation system is calculated by numerical calculation method, and investigating parameters variation of multilayer electrometric bearings has influence on the static stability of series seismic isolation system.
  • Keywords
    buckling; earthquake engineering; geophysics computing; machine bearings; mechanical engineering computing; seismology; shear modulus; critical buckling load; mathematical model; multilayer electrometric bearing; numerical calculation method; series seismic isolation system; shear modulus; shooting method; static stability; Bismuth; Lead; Nonhomogeneous media; parameters of multilayer electrometric bearings; series seismic isolation system; shooting method; static stability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Science and Information Technology (ICCSIT), 2010 3rd IEEE International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-5537-9
  • Type

    conf

  • DOI
    10.1109/ICCSIT.2010.5563717
  • Filename
    5563717