DocumentCode :
526676
Title :
Notice of Retraction
A method for computing global delays of Time Petri Nets
Author :
Li Pan ; Song Chen ; Hong Zheng
Author_Institution :
Sch. of Inf. & Commun. Eng., Hunan Inst. of Sci. & Technol., Yueyang, China
Volume :
2
fYear :
2010
fDate :
9-11 July 2010
Firstpage :
652
Lastpage :
656
Abstract :
Notice of Retraction

After careful and considered review of the content of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE´s Publication Principles.

We hereby retract the content of this paper. Reasonable effort should be made to remove all past references to this paper.

The presenting author of this paper has the option to appeal this decision by contacting TPII@ieee.org.

State class methods are a fundamental and most widely applied technique for timing analysis of Time Petri Nets (TPNs). However, the existing state class methods are not suitable for the computation of global time delay, which is an important issue for real-time systems. This paper presents a state class method for the analysis and verification of global time properties in TPNs that addresses the problem. Our method adopts a global time mode, which can efficiently evaluate global time stamps of state classes. This benefits from the introduction of a special reference transition, called zero transition, whose global firing time is always set to zero. We also decompose firing rules into several basic operations. The separation facilitates the introduction of new operations and brings us more flexibility.
Keywords :
Petri nets; delays; real-time systems; timing; firing rules; global firing time; global time delay computing; global time properties verification; global time stamps; real-time systems; state class methods; time Petri net; timing analysis; zero transition; Delay; Firing; Time Petri nets; global delay; state class; zero transition;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Science and Information Technology (ICCSIT), 2010 3rd IEEE International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-5537-9
Type :
conf
DOI :
10.1109/ICCSIT.2010.5564861
Filename :
5564861
Link To Document :
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