DocumentCode :
527885
Title :
Negatively-correlated redundancy circuits evolution: A novel way of robust analog circuit synthesizing
Author :
Liu, Mingguo ; He, Jingsong
Author_Institution :
Dept. of Electron. Sci. & Technol., Univ. of Sci. & Technol. of China, Hefei, China
fYear :
2010
fDate :
25-27 Aug. 2010
Firstpage :
496
Lastpage :
501
Abstract :
Integrated circuit technology has been dramatically developed during the past decades. Reliability of analog circuits becomes more and more important for yield design. However, most state of the art researches are concentrated on analog circuit robust optimization and analog circuit fault detection. There are seldom any researches on analog circuit fault-tolerant design. This paper proposed an negatively-correlated evolution strategy to design fault-tolerant analog circuits. In the proposed strategy, the fault-tolerant circuit can be considered as an ensemble system. The system contains several child circuits. negatively-correlated evolution strategy automatically synthesizes these child circuits, and make sure the errors of each child circuits are negatively correlated to each other. The experimental result shows that, in most circumstances, the circuit with negative correlation redundancy has the best fault tolerant performance compared with the circuit with randomly generated redundancy. The the circuit with duplicated redundancy didn´t has much improvement compared with single circuit. So, the proposed strategy is a beneficial idea towards robust and fault tolerant analog circuit design.
Keywords :
analogue integrated circuits; fault tolerance; integrated circuit design; integrated circuit reliability; redundancy; analog circuit fault-tolerant design; analog circuit synthesis; child circuits; integrated circuit technology; negative correlation redundancy; negatively-correlated evolution strategy; negatively-correlated redundancy circuit evolution; reliability; Analog circuits; Circuit faults; Correlation; Fault tolerant systems; Mathematical model; Redundancy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Computational Intelligence (IWACI), 2010 Third International Workshop on
Conference_Location :
Suzhou, Jiangsu
Print_ISBN :
978-1-4244-6334-3
Type :
conf
DOI :
10.1109/IWACI.2010.5585180
Filename :
5585180
Link To Document :
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