Title :
Reproducible single-byte laser fault injection
Author :
Dutertre, Jean-Max ; Mirbaha, Amir-Pasha ; Naccache, David ; Tria, Assia
Author_Institution :
Deepartement Syst. et Archit. Securisees (SAS), Ecole Nat. Super. des Mines de St.- Etienne (ENSMSE), Gardanne, France
Abstract :
This note describes laser fault experiments on an 8-bit 0.35 μm microcontroller with no countermeasures. We show that reproducible single-byte faults, often considered unfeasible, can be obtained by careful beam-size and shot-instant tuning.
Keywords :
cryptography; fault diagnosis; laser beam effects; microcontrollers; beam-size; microcontroller; shot-instant tuning; single-byte laser fault injection; size 0.35 mum; word length 8 bit; Circuit faults; Doped fiber amplifiers; Encryption; Laser beams; Random access memory; Semiconductor lasers;
Conference_Titel :
Ph.D. Research in Microelectronics and Electronics (PRIME), 2010 Conference on
Conference_Location :
Berlin
Print_ISBN :
978-1-4244-7905-4
