Title :
Analysis of thermal noise and the effect of parasitics in the charge-pump integrator
Author :
Nilchi, Alireza ; Johns, David A.
Author_Institution :
Electr. & Comput. Eng., Univ. of Toronto Toronto, Toronto, ON, Canada
Abstract :
The concept of using capacitive charge-pumps to reduce the power consumption in switched-capacitor (SC) integrators is further extended. It is shown that the charge-pump (CP) integrator can be implemented using both opamp-based and comparator-based SC circuits and achieve significant power savings. When the input sampling capacitor is split into two capacitors, the opamp-based CP integrator ideally consumes 1/4 of the power of a conventional SC integrator, while maintaining almost the same thermal noise performance. An analytical expression for the input-referred thermal noise of the CP integrator is derived and compared with the conventional integrator. The effect of parasitic capacitances on the CP integrator circuit is discussed. Input-referred thermal noise simulation results are provided.
Keywords :
charge pump circuits; comparators (circuits); operational amplifiers; power consumption; thermal noise; capacitive charge-pumps; charge-pump integrator circuit; comparator-based SC circuits; opamp-based SC circuits; parasitics effect; power consumption; switched-capacitor integrators; thermal noise analysis; Capacitance; Capacitors; Charge pumps; Gain; Noise; Power demand; Thermal noise;
Conference_Titel :
Ph.D. Research in Microelectronics and Electronics (PRIME), 2010 Conference on
Conference_Location :
Berlin
Print_ISBN :
978-1-4244-7905-4