• DocumentCode
    527937
  • Title

    Overview of an environment for automated electrical behavioural modelling using data-based methods

  • Author

    Senger, Philipp ; Doelling, Rolando ; Rosenstiel, Wolfgang

  • Author_Institution
    Robert Bosch GmbH, Reutlingen, Germany
  • fYear
    2010
  • fDate
    18-21 July 2010
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    This paper introduces an overview of an automated methodology for electrical black box behavioural modelling. The presented approach rests upon the transient simulation data of the in and output pins of an analogue or mixed signal circuit. This method extracts the magnitude and the phase information by measuring in- and output currents and voltages and creates a new electrical pin compatible black-box model which approximates the real electric behaviour of the original circuit. The behavioural model is made up of cross connected admittance models whose connections consist of complex functions which are approximated using Support Vector Machines. The electrical behavioural models have a speed-up factor up to 37x and an accuracy greater than 95% compared to the original circuit simulation. A special filter structure enables the modeling of frequency, amplitude and load dependent circuits. The electrical functioning of the methodology is shown by a passive second order Butterworth filter and a time variant and active charge pump circuit out of the automotive industry.
  • Keywords
    Butterworth filters; circuit simulation; support vector machines; active charge pump circuit; analogue signal circuit; automated electrical behavioural modelling; automotive industry; cross connected admittance models; data-based methods; electrical black box behavioural modelling; electrical pin compatible black-box model; mixed signal circuit; passive second order Butterworth filter; support vector machines; time variant pump circuit; Adaptation model; Charge pumps; Computational modeling; Integrated circuit modeling; Load modeling; Support vector machines; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ph.D. Research in Microelectronics and Electronics (PRIME), 2010 Conference on
  • Conference_Location
    Berlin
  • Print_ISBN
    978-1-4244-7905-4
  • Type

    conf

  • Filename
    5587141