• DocumentCode
    528058
  • Title

    Physical effects of avalanche CMOS photodiodes

  • Author

    Chan, Chieh Ning ; Chen, Oscal T.-C.

  • Author_Institution
    Dept. of Electr. Eng., Nat. Chung Cheng Univ., Ming-Hsiung, Taiwan
  • fYear
    2010
  • fDate
    5-9 July 2010
  • Firstpage
    824
  • Lastpage
    825
  • Abstract
    Three photodiodes of P-diffusion_N-well_P-substrate, N-well_P-substrate, N-diffusion_P-substrate photodiodes using the TSMC 0.35μm CMOS technology are implemented to understand their breakdown voltages at the Geiger mode. The measured results reveal that a photodiode with a larger perimeter yields a lower breakdown voltage. N-well_P-substrate and N-diffusion_P-substrate photodiodes have the largest breakdown voltage and the best current gain, respectively. Particularly, the electrical fields associated with photodiode´s structures are theoretically derived to support the measured results. The results from our experiments can be beneficial to the photodiode design of a 3D image sensor.
  • Keywords
    CMOS image sensors; avalanche breakdown; avalanche photodiodes; substrates; 3D image sensor; Geiger mode; N-diffusion_P-substrate photodiodes; N-well_P-substrate photodiodes; P-diffusion_N-well_P-substrate photodiodes; TSMC technology; avalanche CMOS photodiodes; breakdown voltage; current gain; size 0.35 mum; Breakdown voltage; CMOS integrated circuits; CMOS technology; Dark current; P-n junctions; Photodiodes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    OptoElectronics and Communications Conference (OECC), 2010 15th
  • Conference_Location
    Sapporo
  • Print_ISBN
    978-1-4244-6785-3
  • Type

    conf

  • Filename
    5588004