DocumentCode :
52847
Title :
Multiple Nanostructures on Full Surface of GZO/GaN-Based LED to Enhance Light-Extraction Efficiency Using a Solution-Based Method
Author :
Shih-Chang Shei
Author_Institution :
Dept. of Electr. Eng., Nat. Univ. of Tainan, Tainan, Taiwan
Volume :
50
Issue :
8
fYear :
2014
fDate :
Aug. 2014
Firstpage :
629
Lastpage :
632
Abstract :
This paper reports a solution-based method for the application of multiple nanostructures on full surface of GZO/GaN-based LEDs to enhance light-extraction efficiency. Ga-doped ZnO (GZO) was deposited to a thickness of 1μm and an n+-InGaN/GaN short-period superlattice structure was grown to improve the electrical characteristics of the LEDs, including series resistance and operating voltage. A solution-based method was used to control the density of ZnO nanoparticles deposited on the SiO2 layer for use as self-assembled etching nanomasks. Multiple nanostructures were simultaneously formed on the surfaces of GZO, p-GaN, and n-GaN by dry etching. The proposed LEDs increase light output power by 10%-27% (at 20 mA) over that of regular GaN-based LEDs. The difference in light output power can be attributed to differences in the shape, thickness, and density of GZO and GaN nanostructures, resulting in a reduction in Fresnel reflection provided by the roughened surface of the GaN-based LEDs.
Keywords :
II-VI semiconductors; III-V semiconductors; electrical resistivity; etching; gallium; gallium compounds; light emitting diodes; nanoparticles; reflectivity; semiconductor superlattices; wide band gap semiconductors; zinc compounds; Fresnel reflection; GZO/GaN-based LED; GaN-ZnO:Ga; InGaN-GaN; current 20 mA; dry etching; electrical characteristics; light output power; light-extraction efficiency; multiple nanostructures; n±-InGaN/GaN short-period superlattice structure; operating voltage; roughened surface; self-assembled etching nanomasks; series resistance; size 1 mum; solution-based method; Etching; Films; Gallium nitride; Light emitting diodes; Nanostructures; Zinc oxide; GaN-based light emitting diode; SILAR; output power;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/JQE.2014.2329897
Filename :
6834744
Link To Document :
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