Title :
Analog IC fault diagnosis by means of supply current monitoring in test points selected evolutionarily
Author :
Golonek, Tomasz ; Grzechca, Damian ; Rutkowski, Jerzy
Author_Institution :
Inst. of Electron., Silesian Univ. of Technol., Gliwice, Poland
Abstract :
This paper describes the technique dedicated to an analog integrated circuit testing by means of supply current monitoring. The minimal set of test points, that allows to achieve the highest possible fault coverage, is determined with the use of genetic algorithm. Thanks to the proposed dynamic scheme of phenotype coding, the optimization process is more efficient than for a standard, static genotype structure realization.
Keywords :
analogue integrated circuits; fault diagnosis; genetic algorithms; integrated circuit testing; analog IC fault diagnosis; analog integrated circuit testing; fault coverage; genetic algorithm; optimization process; phenotype coding; supply current monitoring; Circuit faults; Encoding; Gallium; Monitoring; Optimization; Testing; Tin;
Conference_Titel :
Signals and Electronic Systems (ICSES), 2010 International Conference on
Conference_Location :
Gliwice
Print_ISBN :
978-1-4244-5307-8
Electronic_ISBN :
978-83-9047-4-2
