• DocumentCode
    528850
  • Title

    0.5-V operation variation-aware word-enhancing cache architecture using 7T/14T hybrid SRAM

  • Author

    Nakata, Yohei ; Okumura, Shunsuke ; Kawaguchi, Hiroshi ; Yoshimoto, Masahiko

  • Author_Institution
    Graduate School of System Informatics, Kobe University, Kobe, Japan
  • fYear
    2010
  • fDate
    18-20 Aug. 2010
  • Firstpage
    219
  • Lastpage
    224
  • Abstract
    This paper presents a novel cache architecture using 7T/14T hybrid SRAM, which can dynamically improve its reliability with control lines. Our proposed 14T word-enhancing scheme can enhance its operating margin in word granularity by combining two words in a low-voltage mode. The proposed scheme is suitable for dynamic voltage and frequency scaling (DVFS). In a 65-nm process, it can reduce the minimum operation voltage (Vmin) to 0.5 V, which is 42% and 21% lower, respectively, than the conventional 6T SRAM and the cache word-disable scheme. The respective power reductions are 90% and 65%.
  • Keywords
    Bit error rate; Error correction codes; Random access memory; Redundancy; Transistors; Cache memory; fine-grain control; low power; low voltage; microarchitecture; variation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Low-Power Electronics and Design (ISLPED), 2010 ACM/IEEE International Symposium on
  • Conference_Location
    Austin, TX, USA
  • Print_ISBN
    978-1-4244-8588-8
  • Type

    conf

  • Filename
    5599073