• DocumentCode
    528896
  • Title

    A proposal for a COM express adapter for energy profiling and long-time failure analysis

  • Author

    Plaga, Sven ; Grzemba, Andreas ; Heffernan, Donal

  • Author_Institution
    Univ. of Appl. Sci. Deggendorf, Deggendorf, Germany
  • fYear
    2010
  • fDate
    8-9 Sept. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Since it is possible to use x86 based modules in embedded projects, the complexity of the Embedded World has increased dramatically. This paper describes the results of our current research work, which is aimed at helping the OEM customer of embedded modules, as well as the developers, to track down errors. The paper shows it is possible to monitor the electric power consumption of an embedded module in order to perform instant online energy profiling. The proposed concept consists of an adapter which includes a FPGA and an ARM 7 microcontroller to perform the measurements as well as the data collection. This adapter is put between the x86 “Computer on Module” (which is the Device Under Test (DUT)) and the backplane where it has access to all important buses and signals. The collected data can be accessed remotely via Ethernet and is provided to the DUT using the standardized EC Application Programming Interface (API) or standard bus systems, such as the I2C. The presented work focuses on the widely-used PICMG COM Express Standard but the work can be adapted to other module standards, too.
  • Keywords
    application program interfaces; embedded systems; failure analysis; field programmable gate arrays; microcontrollers; modules; power aware computing; ARM7 microcontroller; COM express adapter; DUT; Ethernet; FPGA; PICMG COM express standard; X86 based modules; electric power consumption; embedded world complexity; long-time failure analysis; online energy profiling; standard bus systems; standardized EC application programming interface; Backplanes; Current measurement; Field programmable gate arrays; Monitoring; Operating systems; Sensors; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Electronics (AE), 2010 International Conference on
  • Conference_Location
    Pilsen
  • ISSN
    1803-7232
  • Print_ISBN
    978-80-7043-865-7
  • Type

    conf

  • Filename
    5599644