Title :
High-accuracy shape measurement by whole-space tabulation board applied to electronic packaging
Author :
Masaya, Akihiro ; Murakami, Ryosuke ; Fujigaki, Motoharu ; Morimoto, Yoshiharu
Author_Institution :
Dept. of Opto-Mechatron., Wakayama Univ., Wakayama, Japan
Abstract :
In this study, high-accuracy shape measurement by grating projection method applied to electronic packaging using whole-space tabulation board. The memory of the board has a phase analysis table and phase-coordinate tables. The brightness data of the recorded grating are stored in the phase analysis table to obtain the phase of the recorded grating. The calibration data using a moving reference plane are stored as a phase-coordinate table to obtain the coordinates of the phase. An experiment to evaluate this system was performed. The analysis speed of shape measurement using the memory board did not depend on a speed of a personal computer. The accuracy of shape measurement using the memory board and using software was almost the same. The analysis speed using the memory board was faster than the one using software.
Keywords :
electronics packaging; shape measurement; analysis speed; calibration data; electronic packaging; grating projection method; high-accuracy shape measurement; memory board; moving reference plane; phase analysis table; phase-coordinate tables; whole-space tabulation board; Calibration; Electronics packaging; Field programmable gate arrays; Gratings; Pixel; Real time systems; Shape measurement; FPGA; Phase-shifting Method; Shape Measurement; Whole-space Tabulation Method;
Conference_Titel :
SICE Annual Conference 2010, Proceedings of
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-7642-8