Title :
A design method for minimum cost path of flying probe in-circuit testers
Author :
Hiratsuka, Yuki ; Katoh, Fumihiko ; Konishi, Katsumi ; Shin, Seiichi
Author_Institution :
Dept. of Syst. Eng., Univ. of Electro-Commun., Tokyo, Japan
Abstract :
This paper focuses on X-Y type in-circuit testers, which has two flying probes. The problem of finding the ordering of inspection points that minimizes the total time of inspection is an expansion of the travelling salesman problem (TSP). We formulate the problem of finding the minimum traveling cost of flying probes as the 0-1 integer programming, and an algorithm to solve this problem is proposed. Experimental results show the effectiveness of the method.
Keywords :
inspection; integer programming; printed circuit testing; travelling salesman problems; 0-1 integer programming; X-Y type in-circuit tester; flying probe in-circuit tester; minimum cost path; travelling salesman problem; Inspection; Linear programming; Printed circuits; Probes; Testing; Trajectory; Traveling salesman problems; 0–1 integer programming formatting; flying probe in-circuit tester; traveling salesman problem;
Conference_Titel :
SICE Annual Conference 2010, Proceedings of
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-7642-8
