DocumentCode :
52984
Title :
Subharmonic Mixing With Field-Effect Transistors: Theory and Experiment at 639 GHz High Above f_{T}
Author :
Lisauskas, Alvydas ; Boppel, S. ; Mundt, M. ; Krozer, V. ; Roskos, Hartmut G.
Author_Institution :
Physikalisches Institut, Johann Wolfgang Goethe-Universität Frankfurt am Main, Frankfurt, Germany
Volume :
13
Issue :
1
fYear :
2013
fDate :
Jan. 2013
Firstpage :
124
Lastpage :
132
Abstract :
We present experimental and theoretical results on subharmonic mixing in field-effect transistors high above the transistor cutoff frequencies f_{T} . Analytical expressions for heterodyne and subharmonic mixing are derived considering different coupling conditions. They have to ensure that the charge density oscillations excited in the transistors\´ channels by the mixing signals overlap spatially. If this is the case, then a high efficiency of the mixing process can be sustained even at frequencies much above cutoff; in fact, the efficiency is predicted to increase with rising frequency when the plasma-wave regime \\omega \\tau \\geq 1 , \\tau being the electron momentum scattering time, is reached. With patch-antenna-coupled zero-drain-bias (passive) mixers, which we have implemented in standard a 150-nm silicon complementary metal–oxide–semiconductor process technology, subharmonic mixing is demonstrated for a signal frequency of 639 GHz and a local-oscillator frequency of 213 GHz (fundamental antenna resonance and its third harmonic). A local-oscillator drive of 8.2 mV yields an amplitude conversion of the electrical voltage of {-}{\\rm 56}~{\\rm dB} . The experimentally determined conversion fully agrees with the derived theory.
Keywords :
Electric potential; FETs; Logic gates; Oscillators; RF signals; Radio frequency; Passive mixing in complementary metal–oxide–semiconductor (CMOS) field-effect transistors; plasma-wave-based electronics; subharmonic and heterodyne mixing; submillimeter wave and terahertz detection;
fLanguage :
English
Journal_Title :
Sensors Journal, IEEE
Publisher :
ieee
ISSN :
1530-437X
Type :
jour
DOI :
10.1109/JSEN.2012.2223668
Filename :
6327585
Link To Document :
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