Title :
The experimental research of the non-brasive cryogenic polishing monocrystalline silicon wafer super-smooth surface
Author :
Shouping, Qu ; Zhongshu, Zhang ; Tianzhu, Liang
Author_Institution :
Inst. of Mech. Eng., Changchun Univ., Changchun, China
Abstract :
Following the development of IC technology, the IC is developed as high density, high integration, and high-performance. It requires that the semiconductor materials should have super-smooth surfaces in the process of machining chips. In this paper, the new technology of ice disc polishing to polish monocrystalline silicon without abrasive on the cryogenic condition is first put forward. The results of the experiment were recorded in detail. In this experiment, some factors on the impact of surface quality are analyzed.
Keywords :
cryogenics; elemental semiconductors; polishing; silicon; IC technology; ice disc polishing; monocrystalline silicon wafer supersmooth surface; nonbrasive cryogenic polishing; surface quality; Electron tubes; ISO; Machining; Pistons; Vibrations; Water pollution; cryogenic polishing; monocrystalline silicon; super-smooth surfaces;
Conference_Titel :
Computer, Mechatronics, Control and Electronic Engineering (CMCE), 2010 International Conference on
Conference_Location :
Changchun
Print_ISBN :
978-1-4244-7957-3
DOI :
10.1109/CMCE.2010.5610095