DocumentCode :
530617
Title :
The experimental research of the non-brasive cryogenic polishing monocrystalline silicon wafer super-smooth surface
Author :
Shouping, Qu ; Zhongshu, Zhang ; Tianzhu, Liang
Author_Institution :
Inst. of Mech. Eng., Changchun Univ., Changchun, China
Volume :
2
fYear :
2010
fDate :
24-26 Aug. 2010
Firstpage :
445
Lastpage :
448
Abstract :
Following the development of IC technology, the IC is developed as high density, high integration, and high-performance. It requires that the semiconductor materials should have super-smooth surfaces in the process of machining chips. In this paper, the new technology of ice disc polishing to polish monocrystalline silicon without abrasive on the cryogenic condition is first put forward. The results of the experiment were recorded in detail. In this experiment, some factors on the impact of surface quality are analyzed.
Keywords :
cryogenics; elemental semiconductors; polishing; silicon; IC technology; ice disc polishing; monocrystalline silicon wafer supersmooth surface; nonbrasive cryogenic polishing; surface quality; Electron tubes; ISO; Machining; Pistons; Vibrations; Water pollution; cryogenic polishing; monocrystalline silicon; super-smooth surfaces;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer, Mechatronics, Control and Electronic Engineering (CMCE), 2010 International Conference on
Conference_Location :
Changchun
Print_ISBN :
978-1-4244-7957-3
Type :
conf
DOI :
10.1109/CMCE.2010.5610095
Filename :
5610095
Link To Document :
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