DocumentCode :
530757
Title :
Trace elements measurement based on stroboscope technology
Author :
Ji, Zou ; Lirong, Wang
Author_Institution :
Electron. & Inf. Eng. Coll., Changchun Univ., Jilin, China
Volume :
3
fYear :
2010
fDate :
24-26 Aug. 2010
Firstpage :
296
Lastpage :
299
Abstract :
Stroboscope method is a non-contact detecting technique through analyzing objects luminous radiation characteristic when the objects are excited by external source such as visible light, X-ray, γ-ray and electron beam etc. By analyzing the excited parameters, we can obtain the trace elements characteristics plot. The experimental results indicate that the measurement has more accuracy and sensitivity.
Keywords :
chemical variables measurement; stroboscopes; luminous radiation; noncontact detecting technique; stroboscope; trace element measurement; Equations; Pollution measurement; Sensitivity; Silicon; Elements measuring; excited parameters; external excited; non-contact detecting; stroboscope;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer, Mechatronics, Control and Electronic Engineering (CMCE), 2010 International Conference on
Conference_Location :
Changchun
Print_ISBN :
978-1-4244-7957-3
Type :
conf
DOI :
10.1109/CMCE.2010.5610331
Filename :
5610331
Link To Document :
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