• DocumentCode
    530784
  • Title

    Electro-optical imaging system identification using pseudo-random binary pattern

  • Author

    Le, Yang ; Jian, Wang ; Jianzhong, Zhang ; Qiang, Sun ; Jianzhuo, Liu

  • Author_Institution
    Changchun Inst. of Opt., Fine Mech. & Phys., Chinese Acad. of Sci., Changchun, China
  • Volume
    3
  • fYear
    2010
  • fDate
    24-26 Aug. 2010
  • Firstpage
    202
  • Lastpage
    205
  • Abstract
    A method using pseudo-random binary pattern is developed for electro-optical imaging system identification. The imaging system is taken as a stable, linear, time-invariant, and causal filter, and its transfer function is measured through the pseudo-random binary sequence impulse responses identification. A digital mirror device (DMD) light projector is developed as the target generator, and wavelet thresholding is used to denoise the captured image. Pre-filtering spectral estimation algorithm with adaptive parameter selection is also proposed for the identification process, overcoming the challenge brought by the size limit derived from the optical isoplantic region. Simulations and experiments are presented to show the effectiveness of the proposed method.
  • Keywords
    binary sequences; filtering theory; filters; image denoising; optical images; random sequences; transfer functions; adaptive parameter selection; causal filter; digital mirror device light projector; electro-optical imaging system identification; image denoising; optical isoplantic region; pre-filtering spectral estimation algorithm; pseudo-random binary pattern; pseudo-random binary sequence impulse response identification; transfer function; wavelet thresholding; Computers; Estimation; Optical imaging; Optical variables measurement; DMD light projector; imaging system identification; pseudo-random binary pattern; spectral estimation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer, Mechatronics, Control and Electronic Engineering (CMCE), 2010 International Conference on
  • Conference_Location
    Changchun
  • Print_ISBN
    978-1-4244-7957-3
  • Type

    conf

  • DOI
    10.1109/CMCE.2010.5610366
  • Filename
    5610366