• DocumentCode
    530842
  • Title

    A new method for comparing Zernike circular polynomials with Zernike annular polynomials in annular pupils

  • Author

    Jing, Shao ; Dongmei, Ma

  • Author_Institution
    Changchun Inst. of Opt., Fine Mech. & Phys., Chinese Acad. of Sci., Changchun, China
  • Volume
    1
  • fYear
    2010
  • fDate
    24-26 Aug. 2010
  • Firstpage
    229
  • Lastpage
    232
  • Abstract
    To compare the difference between Zernike annular polynomial and Zernike circular polynomial, an approximate mathematic relationship between Zernike annular polynomial coefficients and SEIDEL coefficients is proposed. A new method is applied in comparing experiment. For real interferometric data of annular wave front, the SEIDEL aberration calculated in different ways is removed from the original wave front. Residual astigmatism aberration in annular polynomial way is close to zero, but defocus and sphere aberration are 0.002709λ, -0.00182λ. The residual SEIDEL using annular polynomial is least. Data used in comparison shows that Zernike annular polynomial is more accurate and meaningful for the decomposition of aberrations and the calculation of Seidel aberrations in annular pupil. The calculation in astigmatism aberration is most accurate and those in defocus and sphere aberration are least accurate, when the first 9 terms are used in approximate solving SEIDEL. More coefficients are needed to obtain the real SEIDEL.
  • Keywords
    Zernike polynomials; aberrations; Seidel aberration; Seidel coefficients; Zernike annular polynomial coefficients; Zernike circular polynomial coefficients; annular pupils; annular wave front; defocus aberration; residual astigmatism aberration; sphere aberration; Artificial neural networks; Physics; Polynomials; Seidel coefficient; Zernike annular polynomials; Zernike circular polynomials;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer, Mechatronics, Control and Electronic Engineering (CMCE), 2010 International Conference on
  • Conference_Location
    Changchun
  • Print_ISBN
    978-1-4244-7957-3
  • Type

    conf

  • DOI
    10.1109/CMCE.2010.5610478
  • Filename
    5610478