• DocumentCode
    530881
  • Title

    Modeling and parameter extraction of SiGe: C HBT´s with HICUM for the emerging terahertz era

  • Author

    Ardouin, B. ; Raya, C. ; Schroter, M. ; Pawlak, A. ; Céli, D. ; Pourchon, F. ; Aufinger, K. ; Meister, T.F. ; Zimmer, T.

  • Author_Institution
    XMOD Technol., Bordeaux, France
  • fYear
    2010
  • fDate
    27-28 Sept. 2010
  • Firstpage
    25
  • Lastpage
    28
  • Abstract
    This paper presents a status of the HICUM model development activities (within the DOTFIVE project) for future technologies. Physics based scalable model libraries are realized for two of the most advanced SiGe:C HBT processes currently available. The parameter extraction methodology is described via two meaningful examples. Measurement and simulation comparisons are shown.
  • Keywords
    Ge-Si alloys; carbon; heterojunction bipolar transistors; semiconductor device models; semiconductor materials; submillimetre wave transistors; HBT; HICUM model development activities; SiGe:C; parameter extraction; parameter extraction methodology; scalable model libraries; Capacitance; Heterojunction bipolar transistors; Integrated circuit modeling; Junctions; Parameter extraction; Resistance; Semiconductor device modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Integrated Circuits Conference (EuMIC), 2010 European
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-7231-4
  • Type

    conf

  • Filename
    5613653