DocumentCode
530934
Title
Characterization of electron device breakdown under nonlinear dynamic operation
Author
Raffo, Antonio ; Di Falco, Sergio ; Vadalà, Valeria ; Vannini, Giorgio
Author_Institution
Dept. of Eng., Univ. of Ferrara, Ferrara, Italy
fYear
2010
fDate
27-28 Sept. 2010
Firstpage
130
Lastpage
133
Abstract
In this paper a new methodology to characterize the breakdown of microwave electron devices under realistic device operation is described. Different experimental examples will be provided in order to demonstrate the validity of the proposed characterization technique with respect to the ones commonly adopted.
Keywords
microwave devices; semiconductor device breakdown; electron device breakdown; microwave electron devices; nonlinear dynamic operation; Current measurement; Electric breakdown; Logic gates; PHEMTs; Radio frequency; Voltage measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Integrated Circuits Conference (EuMIC), 2010 European
Conference_Location
Paris
Print_ISBN
978-1-4244-7231-4
Type
conf
Filename
5613716
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