DocumentCode :
531358
Title :
Analysis of the impact of statistical variations on transmission-line based metamaterial structures
Author :
Ochoa, Juan S. ; Cangellaris, Andreas C.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
fYear :
2010
fDate :
28-30 Sept. 2010
Firstpage :
1397
Lastpage :
1400
Abstract :
Localization theory is employed to investigate the impact of statistical variations in material parameters and lumped-element values on the transmission properties of transmission-line based metamaterial structures. The theory yields closed-form expressions for the calculation of the propagation constant of the disordered structure that are shown to provide an accurate alternative to the more expensive Monte Carlo approach. Application of the theory to the investigation of the transmission properties of a negative refractive index structure demonstrates its use for expedient assessment of the impact of statistical variations in unit cell length and in the values of the lumped reactive elements used in the definition of the structure.
Keywords :
Monte Carlo methods; metamaterials; refractive index; transmission lines; Monte Carlo approach; localization theory; lumped-element values; metamaterial structures; negative refractive index; statistical variations; transmission line;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference (EuMC), 2010 European
Conference_Location :
Paris
Print_ISBN :
978-1-4244-7232-1
Type :
conf
Filename :
5616174
Link To Document :
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