Dielectric characterisation of PCB materials using substrate integrated waveguide resonators

This paper gives the first study of the application of substrate integrated waveguide (SIW) resonators for the characterisation of printed circuit board materials. Simple theoretical considerations for dielectric characterisation with rectangular and circular SIW resonators are given. Both rectangular and circular cavities with different type of coupling have been manufactured and measured in order to characterise low and high permittivity substrates. The retrieved substrate parameters are in agreement with the values specified by the substrate manufacturers.