DocumentCode :
531654
Title :
New negative index material and experimental verification of exceeding diffraction limit
Author :
Kubo, Hiroshi ; Nishibayashi, Kazuhiro ; Sanada, Atsushi
Author_Institution :
Grad. Sch. of Sci. & Eng., Yamaguchi Univ., Ube, Japan
fYear :
2010
fDate :
28-30 Sept. 2010
Firstpage :
25
Lastpage :
28
Abstract :
A two-dimensional negative index material is proposed. It has volumetric structure composed of prism cells with metal bands and wires. The Bloch impedance can be made equal to 120π by parametric studies, and an incident plane wave goes into the material with low reflection. A negative index plane lens is fabricated to measure the field distribution of wave out of the lens. The refocused field profile is shown to be thinner than the diffraction-limited field profile.
Keywords :
diffraction; metamaterials; microwave materials; Bloch impedance; diffraction limit; experimental verification; incident plane wave; metal bands; negative index plane lens; prism cells; two-dimensional negative index material; volumetric structure; wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference (EuMC), 2010 European
Conference_Location :
Paris
Print_ISBN :
978-1-4244-7232-1
Type :
conf
Filename :
5616628
Link To Document :
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