DocumentCode :
531698
Title :
Tunable FBARs: Frequency tuning mechanisms
Author :
Campanella, Humberto
Author_Institution :
Inst. de Microelectron. de Barcelona IMB-CNM, CSIC, Bellaterra, Spain
fYear :
2010
fDate :
28-30 Sept. 2010
Firstpage :
795
Lastpage :
798
Abstract :
Tolerances of the fabrication process, the layout design, the process design, and the physical environment of operation may affect the resonance frequency of thin-film bulk acoustic wave resonators (FBAR). Consequences are poor stability, increased phase noise, and performance degradation at the system level. This paper reviews a variety of frequency tuning mechanisms and techniques intended for frequency control in FBARs. Techniques are classified among fabrication, post-fabrication and during-operation frequency compensation.
Keywords :
acoustic resonators; bulk acoustic wave devices; frequency control; tuning; fabrication process; frequency compensation; frequency control; frequency tuning mechanism; layout design; resonance frequency; thin film bulk acoustic wave resonator; tunable FBAR;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference (EuMC), 2010 European
Conference_Location :
Paris
Print_ISBN :
978-1-4244-7232-1
Type :
conf
Filename :
5616687
Link To Document :
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