• DocumentCode
    531698
  • Title

    Tunable FBARs: Frequency tuning mechanisms

  • Author

    Campanella, Humberto

  • Author_Institution
    Inst. de Microelectron. de Barcelona IMB-CNM, CSIC, Bellaterra, Spain
  • fYear
    2010
  • fDate
    28-30 Sept. 2010
  • Firstpage
    795
  • Lastpage
    798
  • Abstract
    Tolerances of the fabrication process, the layout design, the process design, and the physical environment of operation may affect the resonance frequency of thin-film bulk acoustic wave resonators (FBAR). Consequences are poor stability, increased phase noise, and performance degradation at the system level. This paper reviews a variety of frequency tuning mechanisms and techniques intended for frequency control in FBARs. Techniques are classified among fabrication, post-fabrication and during-operation frequency compensation.
  • Keywords
    acoustic resonators; bulk acoustic wave devices; frequency control; tuning; fabrication process; frequency compensation; frequency control; frequency tuning mechanism; layout design; resonance frequency; thin film bulk acoustic wave resonator; tunable FBAR;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference (EuMC), 2010 European
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-7232-1
  • Type

    conf

  • Filename
    5616687